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Yield Dynamics Announces New Reliability Software

Santa Clara, CA, January 22, 2002 – Yield Dynamics, Inc. today announced the release of the new Genesis Reliability Module. This robust tool expands the capability of the Genesis enterprise yield management software suite for semiconductor manufacturing.

The new software integrates a number of sophisticated techniques for analyzing the reliability of semiconductor devices as well as the tools that produce them into the Genesis platform. By incorporating the latest technological advances in reliability theory, this new tool enables accurate assessment of product and tool reliability significantly faster than conventional techniques, thereby reducing crucial time to market requirements.

Key features in the new Reliability module include:

	Reliability Modeling. Provides support for modeling data using standard reliability distributions such as log-normal, Weibull and exponential. The software provides best-fit model selection criteria as well as fitting the estimates to the model.
	Accelerated Testing. Predicts and models reliability at standard use conditions from failure experiments at accelerated temperature and voltage stress conditions.
	Qualification Testing. Shorten qualification testing plans by incorporating prior knowledge about mean time between failures in equipment and component qualifications using Bayesian statistical methods.

Dr. Richard Kittler, vice president, product development for Yield Dynamics commented that, “Modeling and assessing product reliability is a crucial step in a comprehensive yield management and improvement strategy for semiconductor companies. Genesis’ new Reliability Module packages highly sophisticated mathematical tools for reliability modeling in a form that is readily accessible to engineers at all levels, allowing reliability methodologies to be integrated as part of a unified yield management software solution for the first time.”

Trademarks

Yield Dynamics and Genesis are trademarks of Yield Dynamics, Inc.

About Genesis

Genesis is an enterprise-wide yield management software solution that integrates advanced statistics, data mining, analysis, modeling, custom scripting, and data warehousing technologies to give users improved management and control of the semiconductor manufacturing process. The Genesis suite of hardware-independent software tools can link to and store data from all major data sources in the manufacturing process, including legacy databases, and integrates easily with all related systems. Its powerful data management and analysis tools quickly convert massive amounts of process data into useful information to rapidly increase production yields. Problem areas are identified with easy-to-read visual representations and interactive graphics that allow engineers to explore and validate results.

About Yield Dynamics

Headquartered in Santa Clara, Calif., Yield Dynamics, Inc. is the technology leader in yield management and advanced process control for the semiconductor industry. Yield Dynamics provides the most comprehensive set of software tools available, enabling users to convert large amounts of data into useful information. This allows users to bring products to market rapidly, achieve higher yields, and improve manufacturing productivity and profitability. Additional information about Yield Dynamics can be found at http://www.ydyn.com or by calling (408) 330-9320.