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Yield Dynamics Adds New Tools to Genesis
for Memory-Based Yield Management

SEMICON West, San Francisco, CA, July 22, 2002 – Yield Dynamics, Inc. ("YDI") today announced the release of its new Bitmap Analysis Suite, the latest addition to its Genesis enterprise yield management system. The new product adds powerful tools for managing the yields of semiconductor memory manufacturers.

Developed in close cooperation with YDI’s customer base, the software facilitates the visualization and analysis of memory (bit) failures in semiconductor devices, and the correlation of such failures to optical defects measured at wafer inspection. These correlations may be performed by bitmap pattern, defect classification, defect size, inspection layer, and layout information.

Dr. Richard Kittler, vice president of product development for YDI, stated "Our new bitmap analysis product provides analytical tools for tracking what types of defects or other process anomalies cause patterned bit failures in semiconductor memory devices. By offering this new tool as an integrated part of our Genesis platform for yield management and data mining, the analysis is capable of being performed across all data boundaries, so inline metrology, recipe, and process tool history information are all considered in determining the root cause of memory bit failures."

Yield Dynamics will be demonstrating this new product at SEMICON West in San Francisco, July 22-24, 2002 .

Trademarks

Yield Dynamics and Genesis are trademarks of Yield Dynamics, Inc.

About Genesis

Genesis is a flexible yield management software solution that integrates advanced statistics, analysis, modeling, data mining, and data warehousing technologies to give users improved management and control of the semiconductor manufacturing process and to increase fabrication yields. A suite of hardware-independent software tools, Genesis can link to and store data from all major data sources in the manufacturing process, including legacy databases, and integrates easily with all related systems. Its powerful data management and analysis tools automatically convert massive amounts of process data into useful information. Genesis searches for complex interactions and patterns to identify sources of yield loss. Problem areas are pinpointed with easy-to-read visual representations and interactive graphics that allow engineers to explore and validate results.

About Yield Dynamics

Headquartered in Santa Clara, Calif., Yield Dynamics, Inc. ("YDI") is the technology leader in yield management and advanced process control for the semiconductor industry. YDI provides the most comprehensive set of software tools available, enabling users to convert large amounts of data into useful information that allows them to ramp products rapidly and achieve higher yields. Additional information about Yield Dynamics can be found at http://www.ydyn.com or by calling (408) 330-9320.

Yield Dynamics Adds New Tools to Genesis for Memory-Based Yield Management

Yield Dynamics Adds New Tools to Genesis
for Memory-Based Yield Management