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Yield Dynamics Releases New Version of its
Genesis Enterprise™ Yield Management Platform
Defect
Shape Classification and Lot/Event Analysis lead the
powerful and unique new features in this Genesis release
Sunnyvale, CA, April 20, 2004
–
Yield Dynamics, Inc. (“YDI”) announced the release of Genesis 3.6, its
enterprise-wide platform for semiconductor yield improvement. In
addition to implementing many enhancements as a direct result of inputs
from YDI customers, technology partners and affiliates worldwide, YDI has
continued to proactively expand its portfolio of new industry-leading
features not offered in any other commercially available yield management
system.
Highlights of the new features in Genesis 3.6 include:
Defect Shape Classification. Genesis can automatically
classify defects as part of shape or shape primitives from user-defined
libraries, leading to a faster determination of the sources of yield loss.
Completely integrated with the memory and parametric analyses available in
Genesis, the user can, for example, quickly determine the bit-correlated
hit rate of defects from a systematic CMP micro-scratch versus a handling
scratch shape.
Lot/Event Analysis and Correlation with Data Mining. New
features can now quickly merge event, or non-lot based data such as
equipment preventive maintenance events, or equipment health measurements,
with lot-based data, both by tool and by process step. YDI’s
patented Yield Mine® software platform has been extended to support the
background correlation analysis of lot data with event data, allowing
yield engineers to quickly determine how lot yields are affected by
equipment qualification and maintenance events, or facility events.
This analysis is particularly useful during tool qualification or new
sub-100nm process development phases of 300mm manufacturing lines.
Data Mining. Yield Dynamics is continuously expanding its
data mining platform with new features that meet and exceed the
requirements of customers facing the increasing complexities operating
today’s leading-edge semiconductor production facilities. Genesis
3.6 adds numerous new features to the Yield Mine® platform, including new
modules for tool chamber analysis, the use of proprietary focus groups to
further accelerate categorical responses, and an improved user interface
for selecting alternative split rules with commonality display. The
industry’s leading data mining standard has also been expanded to include
tool usage analysis and parametric sensitivity analysis.
WET to Sort Correlation. A new parametric analysis module
enables the direct correlation between sampled wafer electrical test data
and sort data, including proprietary “what if” scenarios for improving
sort yield by shifting WET distributions.
Integrated Data Infrastructure for In-Fab and Post-Fab Results.
Genesis 3.6 embodies a new data retrieval engine (Genesis Data Retrieval™,
or GDR™) that allows for the enterprise-level unification of all data
types within one intuitive GUI, including: defect, metrology, process
data, WIP, bitmap, sort bin, sort parametric, assembly, and packaged unit
data. GDR is completely integrated within the Genesis platform,
supporting direct drill-down and drill-up capabilities from any chart or
analysis generated by Genesis.
Development Platform. Further improvements to the Genesis
Workflow Development Platform™ include the addition of many new engines
and scripting functions, as well as improved background report generation
capability. Genesis Workflows have proven to be a highly effective
custom yield management development platform, enabling customers to
quickly create proprietary yield management analysis methodologies using a
graphical “drag and drop” interface, thereby avoiding the need for
complicated and costly internal software development efforts.
Genesis 3.6 is currently available to customers worldwide. For
additional information, please contact sales@ydyn.com.
About Yield Dynamics, Inc.
Headquartered in Sunnyvale, Calif., Yield Dynamics, Inc. is the leading
provider of enterprise yield management and advanced process control
software for semiconductor and flat panel display (FPD) manufacturers, as
well as fabless chip design companies. The company’s extensible software
platform enables customers to quickly identify and correct semiconductor
and FPD production failures, achieving faster product ramps and higher
yields. Additional information about Yield Dynamics can be found at
http://www.ydyn.com or by calling (408) 773-3100.
Trademarks
Yield Dynamics, Genesis, Genesis Enterprise, Yield Mine, Workflow
Development Platform, Genesis Data Retrieval, and GDR are trademarks or
registered trademarks of Yield Dynamics, Inc.
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