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Japan’s New 300mm Semiconductor Fab
Purchases YDI’s Yield Management Software
Sunnyvale, CA, September 27, 2004
–
Yield Dynamics, Inc. (“YDI”) has recently won a competitive comparison of
advanced Yield Management Software solutions and has been selected to
implement its Genesis Enterprise™ yield improvement platform at a new
300mm Semiconductor fab by one of Japan’s premier electronics companies.
Implementation has started for the Genesis Enterprise platform at this
state-of-the-art 300mm wafer fab, initially operating at the 90nm
technology node, eventually moving to 65nm. The multi-million dollar
order spanned the entire suite of Genesis applications including
parametric analysis, defect analysis, memory analysis, as well as the
Yield Base® enterprise database which allows Yield Dynamics customers to
seamlessly integrate all data sources into one database platform.
This customer has been an active user of Genesis in their other
semiconductor fab locations, and selected it for its newest 300mm fab
because of Genesis’ unparalleled ability to rapidly deliver value in the
yield optimization process.
Some other examples of the technology-leading yield improvement
features found in the Genesis Enterprise platform include: Yield Mine®,
Yield Dynamics’ patented data mining solution offering the industry’s
leading solution for automatic detection of root cause yield issues;
WorkFlow™, the highly effective custom yield management development
platform which allows customers to quickly create proprietary yield
management analysis methodologies using a graphical “drag and drop”
interface, thereby avoiding the need for complicated and costly internal
software development efforts; Lot/event correlation analysis for examining
the effect of equipment measurements on lot/wafer yields; Defect shape
classification for analyzing particular patterns of optical defects and
their effect on yield; Memory electrical defect density analysis to
correlate defect, memory, and functional parametric failures; and Bitmap
clustering analysis for automatically detecting systematic patterns of
memory failures.
“We are pleased by the continued selection and acceptance of Genesis
Enterprise in advanced fabs in Japan,” commented Sid Saito, Director of
Tokyo Electron Ltd.’s ("TEL's") Advanced Inspection and Metrology Group,
and exclusive distributors of YDI products in Japan. “Since TEL
began its distribution with YDI more than five years ago, we are proud to
have sold their leading-edge products to all of the major Japanese
semiconductor companies. The successful TEL-YDI relationship is based on
both the ongoing innovation in yield management software technology
provided by Yield Dynamics from its worldwide research facilities,
combined with TEL’s world-leading customer support infrastructure.
Together we are able to consistently deliver products that allow our
customers to greatly improve their production yields in the world’s most
advanced semiconductor facilities.”
About Yield Dynamics, Inc.
Headquartered in Sunnyvale, Calif., Yield Dynamics, Inc. is the leading
provider of enterprise yield management and advanced process control
software for semiconductor and flat panel display (FPD) manufacturers, as
well as fabless chip design companies. The company’s extensible software
platform enables customers to quickly identify and correct semiconductor
and FPD production failures, achieving faster product ramps and higher
yields. Additional information about Yield Dynamics can be found at
http://www.ydyn.com or by calling (408) 773-3100.
Trademarks
Yield Dynamics, Genesis Enterprise, Genesis, WorkFlow, Yield Mine, and
Yield Base are trademarks or registered trademarks of Yield Dynamics, Inc.
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