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Genesis Enterprise™

Extensible software combines parametric, defect and memory yield optimization in one unified platform with data mining and workflow development across all data sources.

The Genesis Enterprise™ Yield Maximization Platform is the cumulative result of yield management experience gained from customers such as world leading microprocessor and memory manufacturers, foundries, and fabless producers. Through these established customer relationships as well as close partnerships with leading universities, Genesis has proven to be the most advanced technological platform for yield maximization for customers who require the most advanced enterprise level yield management.

Through its patented Yield Mine® automated decision making technology, Genesis has reduced the analysis time to find root causes of yield excursions in their leading edge production line by a factor of five, according to the world's foremost semiconductor foundry.

As the industry’s only true enterprise platform, data may be imported seamlessly from any data source, whether parametric, defect, memory, design, or assembly and packaging. The Yield Base® and Metadata™ data management and connectivity infrastructure assures reliable integration into the Genesis analysis and reporting platform.

Genesis™ enables customers with a complete yield management enterprise platform that includes data acquisition and integration, data analysis, automated decision making through data mining, a development environment through work flow and scripting, and specialized analysis algorithms to identify and correct spatial anomalies, wafer processing sequence problems, commonality of effects, detection of outliers and trends, and yield modeling to assess the impact of the design on the "manufacturability" of the resulting chip.

The Genesis Enterprise™ platform includes the following components:

Click on any header to see product screenshot examples

Infrastructure Core

	Yield Base® enterprise database with schema
	Enterprise Metadata™ manager
	Inter-operability framework (defect/parametric/bin/bitmap)
	Automation software
	Database utilities suite (restore, browser, archive, de-archive)
	Data sources management software (reader/writers and data loaders)
	Flextract® data integration development platform
	Pre-configured extraction GUI's
	Custom extraction GUI editor
	Enterprise replication manager
	Scripting engine runtime license manager
	License manager software
	Data normalization infrastructure
	Permissions management

Viewers

	Genesis Explorer
	Wafer Map Viewer
	Bitmap Viewer
	Defect Viewer
	Image Viewer

Parametric Analysis

	Parametric Charts (Box-Whisker, Histogram, Pareto, Pie, Q-Q, SPC, Trend, X-Y, X-Y-Z, etc.)
	Parametric Reports (Extremities, Summary Reports, Tabulation Reports, Web Reporting, etc.)
	Product Characterization Analysis (Guard Band, Marginal Parameters, Shmoo, Two-Condition Analysis)
	Repeating Bin Analysis (Die, Wafer, Reticle)
	Repeating Parametric Analysis
	Parametric Zonal Analysis
	Parametric Wafer Positional Analysis
	Systematic/Random/Reticle Yield Analysis
	Bin and Parametric Spatial Signature Analysis
	Commonality Analysis
	Cyclical Trend Analysis
	Equipment and Equipment Group Studies
	Parametric Outlier Analysis
	Shift Analysis
	Split-Lot Analysis
	Parametric Reliability Analysis
	Yield Modeling Analysis (Extract Yield Components, Predict Yield for New Product, Yield Forecasting, etc.)
	Parametric Sensitivity Analysis
	WET to Sort Analysis
	Tool Usage Analysis

Defect Analysis

	Defect Charts
	Defect Reports
	Adder/Repeater/Clustering Analysis
	Defect Limited Yield Calculation
	Repeating Defect Analysis (Die, Wafer, Reticle)
	Defect Yield Predictor and Modeling
	Defect Layer Sensitivity Analysis
	Commonality Analysis
	Split-Lot Analysis
	Bin to Defect Correlation
	Kill Ratio Analysis
	Defect Sampling Analysis (Size, Count, Radius, etc.)
	Defect Wafer Positional Analysis
	Defect Cyclical Analysis
	Defect Zonal Analysis
	Defect Spatial Signature Analysis
	Defect Shape Classification

Memory Analysis

	Bitmap Classifier and Signature Editor
	Bitmap Charts
	Bitmap Reports
	Defect to Bitmap Correlation
	Signature to Defect Correlation
	Kill Ratio Analysis
	Repeating Signature Analysis (Die, Wafer, Reticle)
	Repeating Bit Analysis (Die, Wafer, Reticle)
	Matched Failures Defect Limited Yield Analysis
	Bitmap Zonal Analysis
	Bitmap Electrical Defect Density

Statistical Analysis

	Basic statistics
	ANOVA
	MANOVA
	Kruskal-Wallis Non-Parametric ANOVA
	Principal Components
	Correlation Analysis
	Regression (linear and multiple)
	Two-Sample Comparison
	Design of Experiments

Data Mining

	Yield Mine® patented decision-tree analysis
	Yield Map™ neural network self-organizing map analysis
	Spatial Signature Analysis (wafer classification, tests of spatial randomness, and spatial interpolation)

Development Platform Tools

	Workflow™ Development Platform
	Workflow API
	Scripting Engine
	Scripting Recorder
	Scripting API