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enTune™
APC
Genesis
Enterprise™
Genesis
Fabless™
Genesis
FPD™
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Genesis Fabless™
Turn-Key Yield Maximization Software for
Fabless Production Environments
The Genesis Fabless™ Turnkey Yield
Maximization Software platform offers the same powerful yield learning
technologies featured in Genesis Enterprise™, gained from
customers such as world leading microprocessor and memory manufacturers,
foundries, and fabless producers; but specially engineered to also include
the unique features needed to meet the challenges of today's fast moving
fabless sector.
Through its patented Yield Mine DFM® (Design for
Manufacturability) automated decision making technology, Genesis Fabless
has dramatically reduced the analysis time to find root causes of design
for manufacturability issues in foundry production data.
The Yield Base® and Metadata™ technologies embedded
within the Genesis Fabless platform assure seamless data
integration between the fabless company and its foundries, test houses,
and contract assembly locations. Data is automatically integrated
into a data core allowing the specialized Genesis Fabless analysis
tools to quickly highlight excursions compared to vendor designs.
The available turnkey option provides the customer with a pre-configured
database, pre-loaded software for rapid uptime, at an affordable price.
Data analysts, engineers, and managers can quickly begin to utilize the
scalable platform in managing multiple data sets from outsourced
operations around the world.
Genesis Fabless™ empowers fabless producers with a complete
platform, with data acquisition, integration and analysis specifically
engineered for the fabless sector. Some of its many powerful
features include: a development environment through work flow and
scripting, parameter sensitivity analysis, test/marginal parameters
analysis, test sequence correlation analysis, parameter trending and
excursion analysis, guard banding, visualization through wafer map
overlay, interactive graphics with drill down, web publishing and web
interface capability (Genesis Web), and specialized analysis algorithms to
comprehensively assess the impact of the design on the
"manufacturability" of the resulting chip.
The
Genesis Fabless™ platform includes:
Click
on any header to see product screenshot examples
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Yield
Base®
enterprise database for fabless environments with schema |
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Enterprise
Metadata™ manager |
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Inter-operability
framework |
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Automation
software |
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Database
utilities suite (restore, browser, archive, de-archive) |
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Data
sources management software (reader/writers and data loaders) |
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Flextract®
data integration development platform |
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Pre-configured
extraction GUI's |
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Custom
extraction GUI editor |
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Enterprise
replication manager |
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Scripting
engine runtime license manager |
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License
manager software |
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Data
normalization infrastructure |
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Permissions
management |
Viewers
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Genesis Explorer |
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Wafer Map Viewer |
Parametric
Analysis
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Parametric Charts (Box-Whisker, Histogram, Pareto,
Pie, Q-Q, SPC, Trend, X-Y, X-Y-Z, etc.) |
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Parametric Reports (Extremities, Summary Reports,
Tabulation Reports, Web Reporting, etc.) |
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Product Characterization Analysis (Guard Band,
Marginal Parameters, Shmoo, Two-Condition Analysis) |
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Repeating Bin Analysis (Die, Wafer, Reticle) |
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Repeating Parametric Analysis |
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Parametric Zonal Analysis |
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Parametric Wafer Positional Analysis |
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Systematic/Random/Reticle Yield Analysis |
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Bin and Parametric Spatial Signature Analysis |
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Commonality Analysis |
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Cyclical Trend Analysis |
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Equipment and Equipment Group Studies |
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Parametric Outlier Analysis |
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Shift Analysis |
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Split-Lot Analysis |
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Parametric Reliability Analysis |
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Yield Modeling Analysis (Extract Yield Components,
Predict Yield for New Product, Yield Forecasting, etc.) |
Statistical
Analysis
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Basic statistics |
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ANOVA |
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MANOVA |
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Kruskal-Wallis Non-Parametric ANOVA |
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Principal Components |
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Correlation Analysis |
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Regression (linear and multiple) |
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Two-Sample Comparison |
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Design of Experiments |
Data
Mining
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Yield Mine® patented decision-tree analysis |
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Yield Map™ neural network self-organizing map
analysis |
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Spatial Signature Analysis (wafer classification,
tests of spatial randomness, and spatial interpolation) |
Development
Platform Tools
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Workflow™ Development Platform |
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Workflow API |
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Scripting Engine |
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Scripting Recorder |
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Scripting API |

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