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Genesis FPD™

Yield Maximization Software for Thin-Film Transistor Flat Panel Display

The Genesis FPD™ Yield Maximization Software platform implements the industry leading technologies featured in Genesis Enterprise™, gained from customers such as world leading microprocessor and memory manufacturers, foundries, and fabless producers, but specifically engineer for the thin-film transistor liquid crystal display (TFT-LCD) market requirements for data collection, storage, visualization, and daily production yield monitoring and reporting.

Genesis FPD™ permits flat panel display manufacturers to meet the escalating production challenges posed by increasing plate sizes and screen resolutions, thereby dramatically reducing the analysis time required to find root causes of yield issues.

Optical defects from inspection processes are correlated against pixel failure through the application of patented Yield Mine FPD™ automated decision making technology. This rapidly determines the process equipment, defect classes, sizes, and layers that are most likely to cause fatal and expensive pixel failures.

Genesis FPD™ also allows customers to easily monitor the production process through a wide selection of pre-configured reports, charts, and analyses, in addition to custom analyses through on-demand workflow development.

The Genesis FPD™ platform includes:

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Infrastructure Core

	Yield Base® enterprise database with schema
	Enterprise Metadata™ manager
	Inter-operability framework (defect/parametric/bin/bitmap)
	Automation software
	Database utilities suite (restore, browser, archive, de-archive)
	Data sources management software (reader/writers and data loaders)
	Flextract® data integration development platform
	Pre-configured extraction GUI's
	Custom extraction GUI editor
	Enterprise replication manager
	Scripting engine runtime license manager
	License manager software
	Data normalization infrastructure
	Permissions management

Flat Panel Analysis Engines

	Panel View (Single, Composite, Gallery)
	Glass Warpage Analysis
	Equipment/Chamber Analysis
	Commonality Analysis
	Outlier Analysis
	Shift Analysis
	Split-Lot Analysis
	Production Monitoring Charts (Box-Whisker, Histogram, Pareto, Pie, Q-Q, SPC, Trend, X-Y, X-Y-Z, etc.)
	Production Monitoring Reports (Extremities, Summary Reports, Tabulation Reports, Web Reporting, etc.)

Statistical Analysis

	Basic statistics
	ANOVA
	MANOVA
	Kruskal-Wallis Non-Parametric ANOVA
	Principal Components
	Correlation Analysis
	Regression (linear and multiple)
	Two-Sample Comparison
	Design of Experiments

Data Mining

	Yield Mine® patented decision-tree analysis
	Yield Map™ neural network self-organizing map analysis
	Spatial Signature Analysis (wafer classification, tests of spatial randomness, and spatial interpolation)

Development Platform Tools

	Workflow™ Development Platform
	Workflow API
	Scripting Engine
	Scripting Recorder
	Scripting API